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- DC Hipot test is provided with the patented Discharge DC high-voltage fast discharge device to protect personnel from the electric shock resulted from the residual voltage remaining on the DUT.
- Patented Smart GFI patented smart high voltage electric shock circuit (Pat. 169000) can detect loops at any time to eliminate electrical shock and protect the safety of personnel.
- Patented Ramp High function (Pat. 100859) shortens ramp up time, saves test time, and improves test efficiency.
- Patented Charge Low function (Pat. 106128) can detect a circuit break thereby improves test reliability.
- Key lock function is provided to protect memory data and avoid the damages caused by users hitting the keyboard inadvertently.
- Provides GPIB or USB & RS232 interface and performs automated testing in improving test efficiency.
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